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Differential Measurements of an AC Source with a Josephson Arbitrary Waveform Synthesizer
Data provided by National Institute of Standards and Technology
The abstract of the paper [1] is:This paper describes differential sampling measurements of an ac source and a Josephson arbitrary waveform synthesizer (JAWS).A new iterative approach for aligning the phases of the JAWS and the source waveforms was implemented to minimize the differential voltage at the digitizer.
Tags: Josephson arrays,Measurement techniques,standards,superconducting integrated circuits,voltage measurement,
Modified: 2025-04-06
Data for Filtering Organized 3D Point Clouds for Bin Picking Applications
Data provided by National Institute of Standards and Technology
Contains scans of a bin filled with different parts ( screws, nuts, rods, spheres, sprockets). For each part type, RGB image and organized 3D point cloud obtained with structured light sensor are provided. In addition, unorganized 3D point cloud representing an empty bin and a small Matlab script to read the files is also provided. 3D data contain a lot of outliers and the data were used to demonstrate a new filtering technique.
Tags: 3D point cloud,stochastic outlier removal,filtering 3D data for bin picking,
Modified: 2025-04-06
Markerless Body Tracking System Results for Industrial Exoskeletons
Data provided by National Institute of Standards and Technology
Red, Green, and Blue (RGB) and depth markerless body tracking systems were applied for industrial exoskeletons. The original images and their body tracking results are described in this data set. The data set describes the body tracking result changes by exoskeletons, industrial task poses, and camera viewpoints. A full-body exoskeleton, an upper-body exoskeleton, and an exosuit are used in the test. Stand, bend forward, squat, and crouch are defined as industrial poses with stretching arms forward, forward-up, up, forward-down, or down.
Tags: Exoskeleton,body tracking,RGD-Depth,
Modified: 2025-04-06
Standard Reference Material (SRM) 3290 Dry Cat Food Data
Data provided by National Institute of Standards and Technology
This data comprises the information that was used to assign values, the assigned values themselves, and the associated uncertainties. Certificate date 20 May 2024.
Tags: cat food,pet food,nutrition,proximates,fatty acids,vitamins,elements,amino acids,
Modified: 2025-04-06
Dataset demonstrating feasibility of two-ladder sensing approach
Data provided by National Institute of Standards and Technology
Datasets included in manuscript on simultaneous two-ladder sensing, titled "Independent Rydberg Atom Sensing using a Dual-Ladder Scheme" to be submitted to Applied Physics Letters. The data for figure 1 contains experimental EIT traces for both ladders, and figure 2 contains the data for false-color plots showing the polarization-specific response of each ladder.
Tags: Rydberg atoms,atomic physics,receivers,fields strength,electric field,volts/meter,
Modified: 2025-04-06
Interlaboratory Measurement of Adeno-Associated Virus:Comparative Quantification of Full and Empty Capsids
Data provided by National Institute of Standards and Technology
Summary Data For Interlaboratory Study on Adeno-Associated Virus Particles. This contains all the data to be published in a journal article detailing the measurement of full-to-total ratio by analytical ultracentrifugation, size exclusion chromatography-multiangle light scattering, polymerase chain reaction, and ultraviolet spectrophometry. Samples here consisted of nominally 100% full particles, nominally 0% full particles, and a 50:50 mixture of the two.
Tags: AAV,interlaboratory,AUC,SEC-MALS,PCR,UV-Vis,
Modified: 2025-04-06
Data for "A 64-pixel mid-infrared single-photon imager based on superconducting nanowire detectors"
Data provided by National Institute of Standards and Technology
Numerical values of all data points shown in figures for manuscript "A 64-pixel mid-infrared single-photon imager based on superconducting nanowire detectors", available on arXiv (https://arxiv.org/abs/2309.16890)and in Applied Physics Letters 124, 042602, (2024) (https://doi.org/10.1063/5.0178931).
Tags: SNSPD,single photon detector array,mid-infrared,superconducting detector,
Modified: 2025-04-06
Python tools for OpenFOAM simulations of fused filaments in embedded 3D printing, Version 1.2.0
Data provided by National Institute of Standards and Technology
In embedded 3D printing, a nozzle is embedded into a support bath and extrudes filaments or droplets into the bath. Using OpenFOAM, we simulated the extrusion of filaments and droplets into a moving bath, for single filaments, single filaments being disturbed by a nozzle, and printing pairs of filaments. OpenFOAM is an open source computational fluid dynamics solver.
Tags: OpenFOAM,computational fluid dynamics,3D printing,embedded 3D printing,bioprinting,polymer,rheology,interfacial energy,
Modified: 2025-04-06
OpenFOAM simulations of filament fusion in embedded 3D printing
Data provided by National Institute of Standards and Technology
In embedded 3D printing, a nozzle is embedded into a support bath and extrudes filaments or droplets into the bath. However, moving the nozzle near an existing structure and writing new filaments can cause deformation and lack-of-fusion defects. Using OpenFOAM, we simulated what happens when a nozzle moves near an existing filament, and when a nozzle writes a second filament next to an existing filament. OpenFOAM is an open source computational fluid dynamics solver. This work used OpenFOAM 8 on a computing cluster. OpenFOAM input files were generated using Python 3.7.
Tags: 3D-printing,extrusion,support-bath,Herschel-Bulkley,rheology,surface tension,OpenFOAM,
Modified: 2025-04-06
On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors
Data provided by National Institute of Standards and Technology
Here are included figures and other relevant data from the paper "On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors" to be published in International Microwave Symposium 2024.Introduction: On-wafer calibrations are critical for measurements of embedded devices at the correct reference planes. A major challenge in on-wafer calibrations is the development of accurate calibrations that cover a frequency range from MHz to THz. Another challenge facing on-wafer measurements is the lack of calibrations that are directly traceable to the SI.
Tags: On-Wafer Calibration; chip; TRL; Series Resistor; calibration comparison;,
Modified: 2025-04-06