This comprehensive data set includes the electrical characterization measurements of sputtered Nb/a-Si/Nb Josephson junctions (JJs) for high-speed and high-density superconducting electronics. JJs were studied with critical current densities (Jc) ranging from 0.01 mA/?m^2 to 3 mA/?m^2 and with and without annealing at various temperatures. These properties indicate that Nb/a-Si/Nb Josephson junctions are a potential candidate to extend the speed and circuit density of superconducting electronics to 50 nm diameter (25 mA/?m^2) JJs.

Time-sensitive networking (TSN) is an emerging topic for the advancement of wireless networking for industrial applications. TSN, as defined under the umbrella of IEEE 802.1 working group standards, addresses issues related to providing deterministic communications over IEEE 802-based Local Area Networks (LANs). TSN was originally designed to support real-time audio/video applications over Ethernet providing better reliability and lower, more deterministic latency with traffic shaping capabilities.

A set of 6 experiments was performed on poly(methyl methacrylate), PMMA. In each test, samples (i.e., 2.44 m tall, 0.61 m wide slabs of PMMA mounted in a parallel panel configuration) were exposed to a propane burner (nominal heat release rate, HRR = 60 kW), which was turned off after sustained flaming was observed across the panel walls.

Demonstrations and utilities using XSLT in the web browser. XSLT 1.0 is supported with no dependencies on external libraries. Source code is in XML, XSLT, Javascript and Typescript.

Data from figure 4 "Measuring photonic optomechanical devices" in manuscript "Integrated photonic optomechanical atomic force microscopy probes batch fabricated using deep UV photolithography," in Journal of Microelectromechanical Systems, doi: 10.1109/JMEMS.2023.3247300.

This 5G NR Sidelink Link-Level Simulator (LLS) is developed by National Institute Standards and Technology (NIST) developers by leveraging the MATLAB-based Vienna 5G NR Link Level Simulator. It requires the Vienna 5G NR LLS Release 1.2, licensed by Institute of Telecommunications TU-Wien and available at https://www.tuwien.at/etit/tc/en/vienna-simulators/vienna-5g-simulators/. It also requires MATLAB version 2021b with the following toolboxes: communication toolbox, 5G tool-box, and signal blocks.

Electromagnetic simulations of Parylene C devices, described in "The influence of intrinsic water and ion permeation of the dielectric properties of Parylene C films". We simulated various geometries of the device with different fluids inside and calculated S-parameters from extracted RLCG results. We also provide scripts to work up the simulation results into S-parameter plots.

A SQLite database containing mass absorption coefficient (both discrete and continuous), atomic sub-shell binding energy, X-ray energy, jump ratio, ground-state occupancy, atomic relaxation rate following core shell ionization and X-ray linewidth data.The data is in the common SQLite format and also available in SQL format. SQLite is an open-source database which is supported on many different platforms.This database represents a compilation of data from other sources.   Each datum is labeled with a literature reference which represents the source.

The Usability Team of the National Institute of Standards and Technology's (NIST) Public Safety Communications Research (PSCR) program works to identify issues faced by first responders surrounding the use of their existing and emerging public safety communication technology. The team conducted an exploratory, sequential, mixed-methods study to gather insights into first responders' needs for and problems experienced with communication technology.

This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE)